Igor Abrosimov

Title: Igor Abrosimov: Semiconductor Test Equipment Inventor

Introduction

Igor Abrosimov is an inventor based in Midlothian, United Kingdom, whose patent work concerns automated test equipment for semiconductor manufacturing. His listed invention addresses signal formatting in systems that test semiconductor components.

Latest Patents

Abrosimov is associated with 1 patent, titled “Fast, Low Power Formatter for Automatic Test System.” The invention describes an automated test system that generates and measures signals at test points on a device under test. Its signal formatter uses an SR latch connected to signal channels, which can convert long timing-generator pulses into short pulses and steer them to the latch’s set or reset inputs.

The design uses high-impedance outputs when the channels are not sending pulses, avoiding the need for multiplexing circuitry or circuitry to logically combine separate channel outputs. This can simplify the test equipment, reduce power requirements, and allow the latch to be set and reset in quick succession with good timing resolution.

Career Highlights

Abrosimov is associated with Teradyne, Inc., a company that develops automated test equipment. His patent reflects work on improving the speed, power use, and hardware simplicity of semiconductor testing systems.

Collaborations

David Coyne is identified as Abrosimov’s coworker. The available information does not specify the nature of their collaboration or whether Coyne contributed to the patent.

Conclusion

Igor Abrosimov’s patent focuses on a compact, low-power signal formatter for automated semiconductor testing, illustrating an engineering approach aimed at simplifying equipment while supporting precise, rapid signal control.