Yonghe, Taiwan

Ie-Fun Lai


Average Co-Inventor Count = 8.2

ph-index = 2

Forward Citations = 52(Granted Patents)


Company Filing History:


Years Active: 2006-2007

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2 patents (USPTO):

Title: Inventor Spotlight: Ie-Fun Lai

Introduction

Ie-Fun Lai is an innovative inventor based in Yonghe, Taiwan. He has made significant contributions to the fields of fault detection and statistical process control, evidenced by his impressive portfolio of patents. With two patents to his name, he continues to advance technology within his field.

Latest Patents

Ie-Fun Lai's latest inventions include:

1. **Fault Detection and Classification (FDC) Specification Management Apparatus and Method Thereof**: This invention comprises an apparatus for effective fault detection and classification. It features a storage device to hold a specification management record and a chart profile record. The specification management record is pivotal as it stores statistical algorithm settings, while the chart profile record contains crucial alarm condition information. The process module, which operates in memory, manipulates the chart profile record based on incoming manipulation messages.

2. **Automatic Statistical Process Control (SPC) Chart Generation Apparatus and Method Thereof**: This innovative system facilitates automatic SPC chart generation. It consists of a storage device that maintains a chamber management tree, a recipe window management tree, and multiple chart profile records. The data acquisition module, residing in memory, is responsible for gathering multiple process events and parameter values. It selects applicable statistical algorithms, calculates statistical values, and generates new chart profiles as needed, ensuring effective process monitoring and control.

Career Highlights

Ie-Fun Lai is currently employed at Taiwan Semiconductor Manufacturing Company Limited (TSMC), where he plays a crucial role in enhancing semiconductor manufacturing processes through his inventive solutions. His expertise is instrumental in driving advancements in fault detection and statistical process control technologies.

Collaborations

Throughout his career, Ie-Fun Lai has collaborated with esteemed colleagues, including Mu-Tsang Lin and Chon-Hwa Chu. These partnerships have fostered a dynamic exchange of ideas and have contributed to the successful development of his patents.

Conclusion

Ie-Fun Lai continues to inspire innovation within the semiconductor industry. His contributions through his patents reflect his commitment to enhancing technology, demonstrating the vital role inventors play in shaping the future of engineering and manufacturing processes.

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