The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2007
Filed:
Sep. 22, 2004
Mu-tsang Lin, Hemei Township, Changhua County, TW;
Yi-yu Wu, Yongkang, TW;
Chia-hung Chung, Shanhua Township, Tainan County, TW;
Jian-hong Chen, Hsinchu Hsien, TW;
Chon-hwa Chu, Taoyuan Hsien, TW;
Ie-fun Lai, Yonghe, TW;
Wen-sheng Chien, Miaoli Hsien, TW;
Mu-Tsang Lin, Hemei Township, Changhua County, TW;
Yi-Yu Wu, Yongkang, TW;
Chia-Hung Chung, Shanhua Township, Tainan County, TW;
Jian-Hong Chen, Hsinchu Hsien, TW;
Chon-Hwa Chu, Taoyuan Hsien, TW;
Ie-Fun Lai, Yonghe, TW;
Wen-Sheng Chien, Miaoli Hsien, TW;
Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;
Abstract
An apparatus for fault detection and classification (FDC) specification management including a storage device and a process module. The storage device stores a specification management record and a chart profile record. The specification management record stores statistical algorithm settings of a parameter and the chart profile record stores chart frame and alarm condition information. The process module, which resides in a memory, receives a manipulation message corresponding to the specification management record, and accordingly manipulates the chart profile record.