Suwon, South Korea

Hyong-yong Lee

This inventor holds 8 USPTO granted patents and 1 published patent application. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2001-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyong-yong Lee. Retrieved from https://idiyas.com/inventor/hyong-yong-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 8 

% Patents Active = 50.0

Average Co-Inventor Count = 1.5

ph-index = 5

Forward Citations = 48(Granted Patents)


Location History:

  • Kyungki-do, KR (2001)
  • Yongin, KR (2002)
  • Suwon-si, KR (2006 - 2012)

Company Filing History:


Years Active: 2001-2012

Loading Chart...
8 patents (USPTO):Explore Patents

Title: Hyong-yong Lee: Semiconductor Memory Device Inventor.

Introduction

Hyong-yong Lee is an inventor based in Suwon, South Korea. His patent work includes semiconductor memory technology, and he is associated with Samsung Electronics Co., Ltd. His portfolio includes 8 patents.

Latest Patents

Lee’s latest listed patent is “Semiconductor Memory Device and Test Method Thereof.” The invention describes a memory cell array that provides two groups of data at a first data rate. During normal operation, an output circuit serially sends both groups to an external terminal at that rate. In test mode, control signals allow the circuit to output either group at a second, potentially lower, data rate without switching the test mode.

Career Highlights

Lee’s listed patent activity reflects work on semiconductor memory devices and testing methods. His association with Samsung Electronics connects his inventive work to a major electronics company.

Collaborations

Lee’s listed coworkers include Chan-sub Jun and Suk-bae Jun.

Conclusion

Hyong-yong Lee’s patent portfolio highlights his contributions to semiconductor memory design and testing, including methods for controlling data output during test operations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…