This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Hung-ping Cheng: Semiconductor Wafer Benchmark Circuit Inventor.
Introduction
Hung-ping Cheng is an inventor associated with Chiayi, Taiwan. His patent work concerns semiconductor wafer testing and process control monitoring.
Latest Patents
Cheng is credited with 1 patent, titled “Benchmark Circuit on a Semiconductor Wafer and Method for Operating the Same.” The invention describes a semiconductor wafer with a benchmark circuit placed on a scribe line between two rows of dies. Switching circuits selectively connect two process control monitoring devices to receive a test signal and output their respective signals, supporting benchmark testing on the wafer.
Career Highlights
Cheng is associated with Taiwan Semiconductor Manufacturing Company, Ltd. His patent reflects work on wafer-level test circuitry and the use of process control monitoring devices.
Collaborations
Cheng’s listed coworker is Chu-feng Liao. Their shared association is connected to the benchmark-circuit patent.
Conclusion
Hung-ping Cheng’s patent focuses on a wafer-based benchmark circuit that selectively tests and reads process control monitoring devices, contributing to semiconductor testing technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile