Taipei, Taiwan

Hung Hua Lin

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hung Hua Lin. Retrieved from https://idiyas.com/inventor/hung-hua-lin-bbn90yko

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 9.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Innovations of Hung Hua Lin

Introduction

Hung Hua Lin is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the area of wafer level packaging.

Latest Patents

Hung Hua Lin holds a patent for a method of bonding a plurality of substrates. His patent, titled "Wafer level packaging bond," describes a process where a first substrate with a silicon bonding layer is bonded to a second substrate with an aluminum bonding layer. This innovative method creates a bond region that features an interface between the silicon and aluminum layers, enhancing the performance and reliability of semiconductor devices.

Career Highlights

Hung Hua Lin is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His work focuses on advancing packaging technologies that are crucial for modern electronic devices.

Collaborations

Hung has collaborated with esteemed colleagues such as Martin Liu and Richard Chu, contributing to various projects that push the boundaries of semiconductor innovation.

Conclusion

Hung Hua Lin's contributions to wafer level packaging and his innovative approach to bonding substrates highlight his importance in the semiconductor field. His work continues to influence the development of advanced electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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