Hui Wang

Title: Innovations by Inventor Hui Wang

Introduction

Hui Wang is a notable inventor based in Newark, CA (US). She has made significant contributions to the field of charged particle beam systems, holding a total of 2 patents. Her work focuses on enhancing the capabilities of imaging and editing devices under test.

Latest Patents

Hui Wang's latest patents include "Enhanced scanning control of charged particle beam systems" and "Open-loop for waveform acquisition." The first patent describes a charged particle beam system that utilizes a scanning control method capable of imaging and potentially editing a device under test (DUT). This system includes a charged particle beam generation unit, such as a focused ion beam (FIB) column, which directs a charged particle beam onto the DUT. The scan controller arrangement implements a finite state machine to manage the application of the charged particle beam based on various scanning control parameters. These parameters can define rectangular scan regions or other shapes through a bit-map.

The second patent, "Open-loop for waveform acquisition," outlines methods and apparatus for open-loop waveform acquisition. This invention provides a method for acquiring an S-curve of an acquisition loop in an electron-beam probe system. The S-curve reflects the response of the acquisition loop to potential differences between the loop and the DUT. The method includes calibrating the acquisition loop to achieve a linear region in the S-curve and using this linear portion to calculate voltage at a probe point of the DUT.

Career Highlights

Hui Wang has worked with several companies throughout her career, including Nptest, Inc. and Credence Systems Corporation. Her experience in these organizations has contributed to her expertise in the field of charged particle beam technology.

Collaborations

Hui has collaborated with notable professionals in her field, including Kenichi Kanai and Hiroyasu Koike. These collaborations have further enriched her work and innovations.

Conclusion

Hui Wang is a distinguished inventor whose contributions to charged particle beam systems have advanced the field significantly. Her patents reflect her innovative approach and dedication to improving technology.