Hsinchu, Taiwan

Huei-Ju Yu

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Huei-Ju Yu. Retrieved from https://idiyas.com/inventor/huei-ju-yu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Innovations of Inventor Huei-Ju Yu

Introduction

Huei-Ju Yu is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology. His innovative work has led to the development of a unique semiconductor structure that enhances image data processing.

Latest Patents

Huei-Ju Yu holds a patent for a semiconductor structure and manufacturing method. This patent describes a semiconductor structure that includes a substrate, an imaging pixel array, and periphery circuitry. The imaging pixel array is designed to capture image data, while the periphery circuitry processes this data through a transistor. The structure features first and second isolations with varying depths and protrusions, which are crucial for the functionality of the semiconductor.

Career Highlights

Huei-Ju Yu is currently employed at Taiwan Semiconductor Manufacturing Company Limited. His work at this leading semiconductor manufacturer has allowed him to collaborate with other talented professionals in the industry.

Collaborations

Some of his coworkers include Jer-Shien Yang and I-Ling Kuo, who contribute to the innovative environment at Taiwan Semiconductor Manufacturing Company Limited.

Conclusion

Huei-Ju Yu's contributions to semiconductor technology exemplify the importance of innovation in advancing image processing capabilities. His patent reflects a significant step forward in the field, showcasing his expertise and dedication to technological advancement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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