Horng-Chuan Sun

Title: Innovations by Horng-Chuan Sun

Introduction

Horng-Chuan Sun is a notable inventor based in Hsinchu Hsiang, Taiwan. He has made significant contributions to the field of probing devices and multi-function probe cards. With a total of 2 patents, his work has advanced the technology used in integrated circuit testing.

Latest Patents

One of his latest patents is a probing device that includes a rack with an outer support member and a center support member. The outer support member bears the touchdown stress when the tester touches down on the circuit layer. The center support member supports the probe assembly and bears the reaction force from the IC wafer during testing. Another significant patent is the multi-function probe card, which features a PCB, multiple probe needles, and a parametric processing system. This system allows for the acquisition of current and voltage parameters, enabling real-time data processing and display.

Career Highlights

Horng-Chuan Sun is currently associated with Mjc Probe Inc., where he continues to innovate in the field of electronic testing. His work has been instrumental in enhancing the efficiency and accuracy of probing technologies.

Collaborations

He has collaborated with notable coworkers such as Wei-Cheng Ku and Chih-Hao Ho, contributing to various projects that push the boundaries of current technology.

Conclusion

Horng-Chuan Sun's contributions to probing devices and multi-function probe cards highlight his innovative spirit and dedication to advancing technology in the electronics industry. His patents reflect a commitment to improving testing methodologies, making him a significant figure in his field.