The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2006
Filed:
Jul. 21, 2004
Horng-chuan Sun, Hsin-chu, TW;
Hui-pin Yang, Tai-ping, TW;
Horng-Chuan Sun, Hsin-chu, TW;
Hui-Pin Yang, Tai-ping, TW;
MJC Probe Inc., Hsin-Chu, TW;
Abstract
A multi-function probe card () includes a PCB (), a plurality of probe needles (), a counter () to acquire a 'piece sequence parameter', a signal-measuring device () via the probe needles () to acquire a current, and a voltage parameters etc. as well as a parametric processing system (). The parametric processing system () includes an I/O unit ()/(), a processing unit (), a time providing unit (), a real time display unit (), and a storing unit (). Moreover, the piece sequence parameter, current parameter, and voltage parameter can be input into the processing unit () through the I/O unit ()/(). Thereafter, a parametric data structure can be set up to record and calculate in accordance with the datum and parameters, and finally to display service processes and conditions of the probe card () through the real time display unit ().