Kawasaki, Japan

Hisao Izawa


Average Co-Inventor Count = 3.4

ph-index = 4

Forward Citations = 48(Granted Patents)


Company Filing History:


Years Active: 1985-1996

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6 patents (USPTO):Explore Patents

Title: Hisao Izawa: Innovator in Pattern Measurement Technology

Introduction

Hisao Izawa is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of pattern measurement technology, holding a total of 6 patents. His work focuses on innovative methods for measuring the positions of hyperfine patterns on substrates, which are crucial in various technological applications.

Latest Patents

One of Hisao Izawa's latest patents is a method and apparatus for measuring pattern positions. This method involves measuring two-dimensional positions of a hyperfine pattern formed on the surface of a substrate. The process includes a pattern position measuring step, where the positions of the pattern are measured in a first flexural configuration. This configuration is produced when the substrate is supported in a first plurality of positions on a stage. Additionally, a flexural configuration detecting step is employed to detect the first flexural configuration of the substrate's surface. Finally, a correcting step adjusts the measured pattern positions to account for variations in the substrate's flexural configuration.

Career Highlights

Throughout his career, Hisao Izawa has worked with prominent companies in the technology sector. He has been associated with Nippon Kogaku K.K. and Nikon Corporation, where he has contributed to advancements in optical and measurement technologies. His expertise in pattern measurement has positioned him as a key figure in the development of innovative solutions in this field.

Collaborations

Hisao Izawa has collaborated with notable professionals in his field, including Junji Hazama and Akikazu Tanimoto. These collaborations have further enhanced his contributions to technology and innovation.

Conclusion

Hisao Izawa's work in pattern measurement technology exemplifies the impact of innovation in advancing industrial applications. His patents and career achievements reflect his dedication to improving measurement techniques, making him a significant figure in the field.

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