Hisao Igarashi

Title: Innovations of Hisao Igarashi in Probe Technology

Introduction

Hisao Igarashi, an esteemed inventor based in Chuo-ku, Japan, has made significant contributions to the field of probe technology. With a total of nine patents registered, Igarashi has carved a niche for himself, particularly focusing on enhancing the durability and efficiency of sheet-like probes used in electronic testing.

Latest Patents

His most recent patents, which include the "Sheet-like probe, method of producing the probe, and application of the probe," exemplify his innovative approach. The patented technology involves a sheet-like probe where electrode structure bodies are seamlessly integrated without emerging from an insulation film. This design achieves remarkable durability and stability during burn-in tests for large-area wafers and circuit devices with closely spaced electrodes. The innovative electrode structure ensures reliable connection conditions, mitigating positional displacement caused by temperature variations.

The sheet-like probe is intricately designed with an insulation layer and an advanced contact film featuring electrode structure bodies arranged to maintain distance within the surface of the insulation layer. Each electrode structure body consists of a front surface electrode section that is exposed, promoting optimal connectivity for high-performance applications. Furthermore, a porous film enhances the functional characteristics of the probe, allowing for flexibility and integrated insulation within fine holes of the porous film.

Career Highlights

Igarashi's accomplishments at JSR Corporation, a prominent company in the semiconductor and materials industry, highlight his expertise in developing advanced testing technologies. His latest inventions reflect a continuous pursuit of innovation, enhancing both the quality and reliability of electronic components.

Collaborations

Throughout his career, Igarashi has collaborated with notable colleagues such as Kazuo Inoue and Katsumi Sato. These partnerships have played a pivotal role in advancing research and development within the domain of electronic probes, fostering an environment of creativity and technical excellence.

Conclusion

Hisao Igarashi's contributions to innovation, particularly in the realm of sheet-like probes, underscore his impact on the field of electronic testing. His work not only showcases his ingenuity as an inventor but also reinforces the significance of collaboration within the industry. As technologies continue to evolve, Igarashi's inventions will likely maintain a crucial place in future developments, ensuring progress in semiconductor testing methodologies.