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For the Inventor, By the Inventor

Miyazaki, Japan

Hiroyuki Hidaka

This inventor holds 8 USPTO granted patents and 4 EPO patents. Top assignee: Mitutoyo Corporation. Active years: 1995-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyuki Hidaka. Retrieved from https://idiyas.com/inventor/hiroyuki-hidaka-dmqmodcv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 8

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.5

ph-index = 4

Forward Citations = 89(Granted Patents)


Location History:

  • Miyazaki-gun, JP (2012)
  • Miyazaki, JP (1995 - 2017)

Company Filing History:

goldMedal8 out of 1,679 
 
Mitutoyo Corporation
 patents

Years Active: 1995-2017

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8 patents (USPTO):Explore Patents
1. 9812094 - Display device for measuring instrument, measuring instrument, method of analogically displaying measured value, and program of analogically displaying measured value (2017-11-07),
2. 9372595 - Surface texture measurement device (2016-06-21),
3. 9291442 - Contour measuring apparatus (2016-03-22),
4. 8347697 - Surface texture measuring device (2013-01-08),
5. 8196457 - Surface texture measuring device, surface texture measuring method and surface texture measuring program (2012-06-12),
6. 6745616 - Surface texture measuring machine, leveling device for surface texture measuring machine and orientation-adjusting method of workpiece of surface texture measuring machine (2004-06-08),
7. 6510363 - Surface texture measuring apparatus (2003-01-21),
8. 5467289 - Method of and an apparatus for measuring surface contour (1995-11-14),

Title: Hiroyuki Hidaka: Innovator in Measuring Instruments

Introduction

Hiroyuki Hidaka is a prominent inventor based in Miyazaki, Japan. He has made significant contributions to the field of measuring instruments, holding a total of eight patents. His innovative designs and methods have advanced the functionality and usability of various measuring devices.

Latest Patents

Hidaka's latest patents include a display device for measuring instruments, a measuring instrument, a method of analogically displaying measured values, and a program for analogically displaying measured values. The display device features a graphic display module and a processing unit that dynamically redraws figures on the display screen in response to changes in measured values. This allows for a more intuitive understanding of measurements. Additionally, his surface texture measurement device enhances user interaction by providing an operation screen and a guidance screen, which displays a list of functions and descriptions for ease of use.

Career Highlights

Hidaka is currently employed at Mitutoyo Corporation, a leading company in precision measuring instruments. His work has been instrumental in developing advanced technologies that improve measurement accuracy and user experience. His dedication to innovation has positioned him as a key figure in the industry.

Collaborations

Hidaka has collaborated with notable colleagues, including Hiroomi Honda and Hideki Mishima. Their combined expertise has contributed to the successful development of various measuring technologies.

Conclusion

Hiroyuki Hidaka's contributions to measuring instruments reflect his commitment to innovation and excellence. His patents and collaborative efforts continue to shape the future of measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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