Miyazaki, Japan

Hiroyuki Hidaka


 

Average Co-Inventor Count = 2.5

ph-index = 4

Forward Citations = 89(Granted Patents)


Location History:

  • Miyazaki-gun, JP (2012)
  • Miyazaki, JP (1995 - 2017)

Company Filing History:


Years Active: 1995-2017

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8 patents (USPTO):Explore Patents

Title: Hiroyuki Hidaka: Innovator in Measuring Instruments

Introduction

Hiroyuki Hidaka is a prominent inventor based in Miyazaki, Japan. He has made significant contributions to the field of measuring instruments, holding a total of eight patents. His innovative designs and methods have advanced the functionality and usability of various measuring devices.

Latest Patents

Hidaka's latest patents include a display device for measuring instruments, a measuring instrument, a method of analogically displaying measured values, and a program for analogically displaying measured values. The display device features a graphic display module and a processing unit that dynamically redraws figures on the display screen in response to changes in measured values. This allows for a more intuitive understanding of measurements. Additionally, his surface texture measurement device enhances user interaction by providing an operation screen and a guidance screen, which displays a list of functions and descriptions for ease of use.

Career Highlights

Hidaka is currently employed at Mitutoyo Corporation, a leading company in precision measuring instruments. His work has been instrumental in developing advanced technologies that improve measurement accuracy and user experience. His dedication to innovation has positioned him as a key figure in the industry.

Collaborations

Hidaka has collaborated with notable colleagues, including Hiroomi Honda and Hideki Mishima. Their combined expertise has contributed to the successful development of various measuring technologies.

Conclusion

Hiroyuki Hidaka's contributions to measuring instruments reflect his commitment to innovation and excellence. His patents and collaborative efforts continue to shape the future of measurement technology.

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