Mitutoyo Corporation

Hiroyuki Hidaka

Hiroomi Honda

Toshihiro Kanematsu

Hideki Mishima

Tsukasa Kojima

Minoru Katayama

Kazushige Ishibashi

Makoto Abe

Yukihiro Sakata

Takao Ishitoya

Morimasa Ueda

Shigekata Ohta

Megumi Fukuda

Mitsuhisa Nakano

Takahumi Kano

Hideki Kai

Hiroyuki Tokitoh

A display device for a measuring instrument, includes: a display screen of a graphic display module; and a processing unit for drawing on the display screen a figure changed in position or shape in response to change in measured value, the processing unit is configured to: calculate first coordinates on the display screen based on a pre-changed value of the measured value; draw at least a part of the figure on the display screen based on the first coordinate; calculate second coordinates on the display screen based on a post-changed value of the measured value; acquire as a redrawing region a region on the display screen based on the first coordinates and the second coordinates; and redraw the redrawing region based on a redrawing function for redrawing only a specified region on the display screen.

Display device for measuring instrument, measuring instrument, method of analogically displaying measured value, and program of analogically displaying measured value

A surface texture measurement device displays in a display an operation screen based on display information of a current operation screen, and displays in the display a guidance screen when guidance display is requested by pressing a guidance screen display button on the operation screen. The operation screen has icon display for one or more buttons that activate predetermined functions. The guidance screen has a button list field that displays a list of icon display and function name display for the buttons included in the current operation screen and a description display field that displays a function description for any of the buttons included in the current operation screen.

Surface texture measurement device

A contour measuring apparatus includes: an arm including a stylus in a distal end and being swingable with respect to a cabinet; an attitude change mechanism configured to change an attitude of the arm within a swing range; a stopper configured to make contact with the arm when the arm moves nearer to an installation part of an object to be measured within the swing range; and a controller configured to operate the attitude change mechanism based on a power-off command and return the arm to a mechanical limit position in which the arm makes contact with the stopper.

Contour measuring apparatus

A surface texture measuring device includes a threshold value storage module configured to store a threshold input through an operation key, a stylus move distance detector configured to detect a move distance in the trace direction of the stylus, a cumulative move distance storage module configured to cumulatively store the move distance of the stylus detected by the stylus move distance detector; and. a notification module (controller) configured to make a comparison between the threshold value stored in the threshold value storage module and the cumulative move distance stored in the cumulative move distance storage module and notifying a user of replacement of the stylus when the cumulative move distance has exceeded the threshold value.

Surface texture measuring device

A surface texture measuring device comprises a display control unit operative to display a drawing symbol entry screen having entry areas of drawing symbols. An entry acceptance unit is provided to accept the input of the drawing symbol into the entry area provided in the drawing symbol entry screen. An arithmetic unit is provided to calculate surface texture information that indicates a surface texture of an object to be measured, from the measurement result of surface displacements of the object, based on the drawing symbol accepted at the entry acceptance unit.

Surface texture measuring device, surface texture measuring method and surface texture measuring program

In advance to measuring texture of the workpiece by a surface texture measuring machine ( ), a workpiece orientation adjustment stage ( ) is manually moved by the surface texture measuring machine ( ) in accordance with calculated orientation correction amount of the workpiece, thus adjusting orientation of the workpiece. Since it is only necessary for an operator to operate respective adjustment means until reaching a displayed correction amount, operation thereof can be facilitated and orientation thereof can be highly accurately adjusted without impairing operability.

Surface texture measuring machine, leveling device for surface texture measuring machine and orientation-adjusting method of workpiece of surface texture measuring machine

A surface texture measuring apparatus allowing effects of vibration disturbance to be removed and a highly accurate measurement to be achieved. The surface texture measuring apparatus is further provided with a small surface texture measuring apparatus, which detects the amount of vibration of a workpiece while maintaining a detecting device in contact with the surface of the workpiece without moving the device along the workpiece. The main surface texture measuring apparatus conducts measurement with a high accuracy based on the detected unevenness value of the surface of the workpiece and on the amount of vibration detected by the small surface texture measuring apparatus.

Surface texture measuring apparatus

A measurement-datum similar to profile of a measuring object set in a measuring area in which a detector and the measuring object are moved relatively is formed to measure the displacement value between the detector and the measuring object through the relative movement based on the measurement-datum to thereby compute the surface contour of the measuring object from the measured data with reference to the measurement-datum. Since the measurement-datum is set in the spatial area, a precise mechanical processing will not be required for an accurate measurement of the measuring object having a strange profile which was not measured by conventional apparatus.

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Miyazaki, Japan

Hiroyuki Hidaka