This inventor holds 5 USPTO granted patents. Top assignee: Hitachi Astemo Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Hiroyuki Hayashi: Innovator in Visual Inspection Technologies
Introduction
Hiroyuki Hayashi is a prominent inventor based in Hitachinaka, Japan. He has made significant contributions to the field of visual inspection technologies, holding a total of 5 patents. His work focuses on enhancing the efficiency and accuracy of inspection processes through innovative apparatus and methods.
Latest Patents
Hiroyuki Hayashi's latest patents include a visual inspection apparatus and method, as well as an image generation apparatus and method. The visual inspection apparatus is designed to inspect the surface of a piston by utilizing a captured image from a camera and a learning result derived from machine learning. This learning process involves using a variety of defective product sample images, which are created by merging a two-dimensional defect image with a three-dimensionally pre-generated defect model. Additionally, his pose change apparatus is equipped with a first output shaft that rotates around a first axis, allowing for precise adjustments during inspections.
Career Highlights
Hiroyuki Hayashi is currently employed at Hitachi Astemo Ltd., where he continues to develop cutting-edge technologies. His career is marked by a commitment to improving inspection methodologies, which has led to the successful patenting of several innovative solutions.
Collaborations
Throughout his career, Hiroyuki has collaborated with notable colleagues, including Takamasa Imaizumi and Shinichi Inoue. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in technology.
Conclusion
Hiroyuki Hayashi's contributions to visual inspection technologies exemplify his dedication to innovation and excellence. His patents reflect a deep understanding of the challenges in inspection processes and a commitment to developing effective solutions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
