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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12607571 B1

PDFFull Text
Date of Patent:
Apr. 21, 2026

Filed:

Dec. 15, 2021

Visual inspection apparatus and visual inspection method

Applicant:

Hitachi Astemo, Ltd., Ibaraki, JP;

Inventors:

Takahiro Fujioka, Hitachinaka, JP;

Hiroki Morii, Hitachinaka, JP;

Takamasa Imaizumi, Hitachinaka, JP;

Hiroyuki Hayashi, Hitachinaka, JP;

Assignee:

HITACHI ASTEMO, LTD., Ibaraki, JP;

Attorney:

Wenderoth, Lind & Ponack, L.L.P.

Primary Examiner:

Tarifur R Chowdhury

Assistant Examiner:

Kemaya undefined Nguyen

Int. Cl.
CPC ...
G01N 21/952 (2006.01); G06T 7/00 (2017.01); G06V 10/141 (2022.01); G06V 10/60 (2022.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/952 (2013.01); G06T 7/0008 (2013.01); G06V 10/141 (2022.01); G06V 10/60 (2022.01); G01N 2021/9511 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A visual inspection apparatus of the present invention includes a rotational portion configured to rotate in a state that an inspection target is placed on the rotational portion, a mirror portion provided so as to reflect the inspection target in the state that the inspection target is placed on the rotational portion, an imaging portion configured to image the inspection target reflected in the mirror portion, an adjustment portion configured to change an imaging angle of the imaging portion relative to the inspection target reflected in the mirror portion, and an inspection portion configured to inspect a surface of the inspection target based on image data captured by the imaging portion.

Find Patent Forward Citations

Fujioka, Takahiro. (2026). Visual inspection apparatus and visual inspection method (U.S. Patent No. 12607571). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12607571

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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