The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Jun. 07, 2022
Hitachi Astemo, Ltd., Hitachinaka, JP;
Hideaki Onozuka, Hitachinaka, JP;
Shinichi Inoue, Hitachinaka, JP;
Takamasa Imaizumi, Hitachinaka, JP;
Hiroyuki Hayashi, Hitachinaka, JP;
HITACHI ASTEMO, LTD., Hitachinaka, JP;
Abstract
Provided is a visual inspection device including: an image pickup unit configured to pick up an image of a surface of an object to be inspected; a posture control unit configured to change a posture of the object to be inspected with respect to the image pickup unit; a storage unit having stored therein a learning result obtained by machine learning using a defective product sample image, the defective product sample image being generated by combining a defect portion image prepared in advance with a non-defective product image of the object to be inspected at a combination position obtained by referring to three-dimensional data corresponding to the object to be inspected tilted so as to form a posture angle set in advance; and an inspection unit configured to inspect the surface of the object to be inspected based on a picked-up image picked up at the posture angle by the image pickup unit and on the learning result.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile