Yokohama, Japan

Hirotomo Yashima


 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2019-2020

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3 patents (USPTO):Explore Patents

Title: Hirotomo Yashima: Innovator in X-ray Inspection Technology

Introduction

Hirotomo Yashima is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of X-ray inspection technology. With a total of 3 patents to his name, Yashima's work has advanced the capabilities of X-ray devices and methods.

Latest Patents

Yashima's latest patents include an X-ray inspection device, an X-ray inspection method, and a method of manufacturing structures. The X-ray inspection device features a radiation source that irradiates X-rays toward a specimen that is rotated. It also includes a detector that detects transmitted X-rays and outputs a plurality of detection data for each angle of rotation. Additionally, a region extracting unit is incorporated to extract a region where the specimen is projected onto the detector using the detection data. His other patent, a measurement processing device for an X-ray inspection device, includes a region information acquisition unit that acquires first region information based on X-rays passing through a first region of a specimen. This device also features a storage unit for second region information related to a larger second region of another specimen, and a determination unit that assesses whether the first region is included in the second region.

Career Highlights

Hirotomo Yashima is currently employed at Nikon Corporation, a leading company in imaging and optical products. His work at Nikon has allowed him to focus on developing innovative technologies that enhance X-ray inspection processes.

Collaborations

Yashima has collaborated with notable colleagues, including Fuminori Hayano and Akitoshi Kawai. Their teamwork has contributed to the advancement of X-ray inspection technologies.

Conclusion

Hirotomo Yashima's contributions to X-ray inspection technology through his patents and work at Nikon Corporation highlight his role as an influential inventor in this field. His innovative approaches continue to shape the future of X-ray inspection methods and devices.

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