Hyogo, Japan

Hiroshi Yamanaka

This inventor holds 1 USPTO granted patent. Top assignee: Japan Electronic Materials Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Yamanaka. Retrieved from https://idiyas.com/inventor/hiroshi-yamanaka-569bbaok

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Hiroshi Yamanaka: Innovator in Probe Card Technology

Introduction

Hiroshi Yamanaka is a notable inventor based in Hyogo, Japan. He has made significant contributions to the field of electronic materials, particularly through his innovative work on probe cards. His inventions aim to enhance the efficiency and cost-effectiveness of high-temperature inspections.

Latest Patents

Yamanaka holds a patent for a probe card designed for high-temperature inspection at a low cost. The invention includes a wiring board that supports a large number of probes, a heat-generating film formed on the wiring board, and a pair of electrode terminals that supply current to the heat-generating film. The heat-generating film is created by applying a heat-generating coating material that contains fine carbon particles dispersed in a binder.

Career Highlights

Hiroshi Yamanaka is currently employed at Japan Electronic Materials Corporation, where he continues to develop innovative solutions in electronic materials. His work has been instrumental in advancing technologies that require precise and reliable inspection methods.

Collaborations

Yamanaka collaborates with talented coworkers, including Yuuki Nakamura and Masatoshi Hasaka, who contribute to the development and refinement of his inventions.

Conclusion

Hiroshi Yamanaka's contributions to probe card technology exemplify his commitment to innovation in the field of electronic materials. His work not only enhances inspection processes but also demonstrates the potential for cost-effective solutions in high-temperature environments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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