Hyogo, Japan

Hiroshi Oshita

This inventor holds 1 USPTO granted patent. Top assignee: Renesas Technology Corp.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Oshita. Retrieved from https://idiyas.com/inventor/hiroshi-oshita-uvrm2oli

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Hiroshi Oshita: Innovator in Semiconductor Manufacturing

Introduction

Hiroshi Oshita is a notable inventor based in Hyogo, Japan. He has made significant contributions to the field of semiconductor manufacturing, particularly through his innovative patent.

Latest Patents

Hiroshi Oshita holds a patent for a method of manufacturing semiconductor devices. This patent focuses on the polishing process of tungsten and silicon oxide films. It involves determining polishing parameters based on the relationship between a residual step and pattern density. The goal is to ensure that the residual step does not exceed a predetermined limit during the polishing process. This innovation leads to the creation of semiconductor devices with optimal planarization and effective plug formation in contact holes.

Career Highlights

Oshita is associated with Renesas Technology Corporation, where he applies his expertise in semiconductor technology. His work has been instrumental in advancing manufacturing processes within the company.

Collaborations

Hiroshi Oshita collaborates with Takashi Watadani, contributing to the development of innovative solutions in semiconductor manufacturing.

Conclusion

Hiroshi Oshita's contributions to semiconductor manufacturing through his patent demonstrate his commitment to innovation in the field. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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