Abiko, Japan

Hiroshi Nakahata

This inventor holds 24 USPTO granted patents and 1 EPO patent, primarily in Optical Scanning Technology. Top assignee: Canon Kabushiki Kaisha. Active years: 2004-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Nakahata. Retrieved from https://idiyas.com/inventor/hiroshi-nakahata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 29.2


Average Co-Inventor Count = 1.4

ph-index = 9

Forward Citations = 172(Granted Patents)


Location History:

  • Ibaraki, JP (2004)
  • Chiba, JP (2007)
  • Chiba-ken, JP (2010)
  • Abiko, JP (2006 - 2020)

Company Filing History:


Years Active: 2004-2020

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Areas of Expertise:
Optical Scanning Apparatus
Image Forming Apparatus
Light Scanning Apparatus
Multibeam Optical Scanning
Photosensitive Member
Beam Splitter
Control Method
Curved Support
Color Image Formation
Optical Device
24 patents (USPTO):Explore Patents

Title: Hiroshi Nakahata: Pioneering Inventor from Abiko

Introduction: Hiroshi Nakahata is a renowned inventor hailing from Abiko, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Hiroshi Nakahata holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his innovative spirit and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Nakahata has worked with leading research institutions and tech companies, developing cutting-edge solutions that have revolutionized industries worldwide.

Collaborations: Throughout his career, Hiroshi Nakahata has collaborated with top engineers, scientists, and inventors, fostering a culture of innovation and excellence in all his projects.

Conclusion: Hiroshi Nakahata's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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