The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Apr. 12, 2013
Canon Kabushiki Kaisha, Tokyo, JP;
Hiroshi Nakahata, Abiko, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A plurality of light beams are simultaneously scanned on a surface of a photosensitive member. The surface of the photosensitive member has a curvature factor, and therefore, the light beams have different optical path lengths. Due to differences in the optical path length, a length (scanning width) of a scanning line of one light beam is different from that of another light beam. When a temperature of an optical scanning apparatus increases, the optical path length differences vary, so that differences in magnification between the beams also vary. Therefore, by obtaining correction amounts for the scanning widths depending on the temperature, the light beams are allowed to have substantially the same scanning width even when the temperature of the optical scanning apparatus varies.