The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2014

Filed:

Jan. 24, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Hiroshi Nakahata, Abiko, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/435 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical scanning apparatus that is capable of increasing use life of a semiconductor laser by decreasing the emission time for sensors that are independently provided for synchronous control, light control, and focus control. A laser beam emitted from a light source is deflected by a deflector, and scans a photoconductor. A beam splitter arranged between the light source and the deflector separates the laser beam, which is detected by a first detection unit. A second detection unit arranged in a non-image forming area detects the deflected laser beam to detect defocus amount. A focusing unit focuses the scanning laser beam based on a detection result of the second detection unit. A control unit controls the light amount of the laser beam applied to an image forming area based on a detection result of the first detection unit at the timing when the second detection unit detects the laser beam.


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