Hiroshi Marumo

Title: Hiroshi Marumo: Innovator in Probe Technology

Introduction

Hiroshi Marumo is a notable inventor based in Kofu, Japan. He has made significant contributions to the field of probe technology, holding a total of 2 patents. His work primarily focuses on enhancing the efficiency and effectiveness of testing electrical characteristics in semiconductor devices.

Latest Patents

Marumo's latest patents include a vertical probe tester card with coaxial probes and a probe apparatus. The vertical probe tester card is designed to electrically connect to a tester and circuits that require testing. It features a plate assembly with a printed board and an earth plate, which are insulated from each other. The probe assemblies are supported by this plate assembly and make vertical contact with the circuit pads. Each probe assembly consists of a center conductor with a sharpened tip that contacts the circuit pad, while a holder conductor and a dielectric provide additional support and insulation. The probe apparatus is designed to test the electrical characteristics of chips on a semiconductor wafer by bringing probes into contact with the pads of each chip. This innovative design allows for efficient testing of power supply potentials, signals, and ground potentials.

Career Highlights

Throughout his career, Marumo has worked with prominent companies such as Tokyo Electron Limited and Tokyo Electron Yamanashi Limited. His experience in these organizations has allowed him to refine his skills and contribute to advancements in probe technology.

Collaborations

Marumo has collaborated with notable coworkers, including Satoru Yamashita and Nobuyuki Negishi. Their combined expertise has fostered innovation in the field of semiconductor testing.

Conclusion

Hiroshi Marumo's contributions to probe technology have significantly impacted the semiconductor industry. His innovative patents and collaborations highlight his dedication to advancing testing methodologies.