Hiroshi Haino

Title: Hiroshi Haino: Inventor in Precision Shape Measurement

Introduction

Hiroshi Haino is an inventor based in Tsukuba, Japan, whose work includes optical interferometry and precision measurement. He is associated with Mitutoyo Corporation and holds 4 patents.

Latest Patents

Haino’s listed patents include inventions for measuring surface shape with interferometric techniques.

“Apparatus and Method for Shape Measurement Using Interferometer” describes a system that captures interference-fringe images while varying the phase difference between test and reference light. The system analyzes those images to determine the test surface’s shape, calculates the surface’s typical plane and its angle relative to the reference surface, and automatically adjusts the test surface’s orientation.

“Shape Measuring Apparatus” presents a compact, lightweight approach to measuring an object’s observed surface. It splits interference light into at least three beams with predetermined phase shifts, captures the resulting fringe images simultaneously using fewer image sensors than images, and calculates the surface shape from the image information.

Career Highlights

Haino’s patent work focuses on improving the accuracy and practicality of optical surface measurement. The described inventions combine interferometry, image processing, and automated adjustment to support precise measurements.

Collaborations

Haino is associated with Mitutoyo Corporation. His listed coworkers include Naoki Mitsutani and Kazuhiko Kawasaki.

Conclusion

Hiroshi Haino’s patents reflect a focus on precise, efficient interferometric measurement, including systems designed to analyze surface shape and streamline measurement equipment.