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For the Inventor, By the Inventor

Tsukuba, Japan

Hiroshi Haino

This inventor holds 4 USPTO granted patents. Top assignee: Mitutoyo Corporation. Active years: 1995-2003.

USPTO Granted Patents = 4

% Patents Active = 100.0

Average Co-Inventor Count = 2.8

ph-index = 3

Forward Citations = 19(Granted Patents)


Location History:

  • Fuchu, JP (1995)
  • Tsukuba, JP (2002 - 2003)

Company Filing History:

goldMedal4 out of 1,677 
 
Mitutoyo Corporation
 patents

Years Active: 1995-2003

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4 patents (USPTO):Explore Patents
1. 6552807 - Apparatus and method for shape measurement using interferometer (2003-04-22),
2. 6496269 - Shape measuring apparatus (2002-12-17),
3. 6473186 - Scanning wide-area surface shape analyzer (2002-10-29),
4. 5408758 - System for compensating spatial errors (1995-04-25),
Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
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