Tokyo, Japan

Hironori Sakurai


Average Co-Inventor Count = 4.6

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2019-2020

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3 patents (USPTO):

Title: Innovations of Hironori Sakurai: A Pioneer in Defect Inspection Technology

Introduction

Hironori Sakurai is an accomplished inventor based in Tokyo, Japan. With a remarkable portfolio of three patents, he has made significant contributions to the field of defect inspection technology. His innovative methods aim to enhance the accuracy and efficiency of defect detection, paving the way for advancements in various industries.

Latest Patents

Sakurai's latest patents include groundbreaking inventions centered around defect inspection devices and methods. The first, titled "Defect Inspection Device and Defect Inspection Method," introduces a defect classification system capable of identifying true and false information regarding defects in inspection targets. This invention facilitates the extraction of defect features even when the data may be insufficient, thereby optimizing the defect extraction parameters.

The second patent, "Flaw Inspection Device and Flaw Inspection Method," offers a technique that reduces the burden on users by allowing them to input multiple reference values. The device then calculates a defect extraction condition that optimizes evaluation values based on actual and false report numbers, enhancing the accuracy of defect detection.

Career Highlights

Hironori Sakurai has worked with prominent organizations, including Hitachi High-Tech Corporation and Hitachi High-Technologies Corporation. His time at these companies allowed him to hone his skills in developing advanced technologies for defect detection and inspection.

Collaborations

Throughout his career, Sakurai has collaborated with notable professionals such as Toshifumi Honda and Takahiro Urano. Together, they have contributed to innovations that have furthered the capabilities of defect inspection technologies.

Conclusion

Hironori Sakurai's dedication to innovation in defect inspection technology not only showcases his prowess as an inventor but also underscores the importance of meticulous defect detection in various industries. With his groundbreaking patents and collaborative spirit, Sakurai continues to impact the field significantly.

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