Hironori Maeda

Title: Hironori Maeda: Innovator in Automated Testing Technologies

Introduction

Hironori Maeda is a notable inventor based in Tatebayashi, Japan. He has made significant contributions to the field of automated testing technologies, holding a total of 5 patents. His work focuses on enhancing the efficiency and effectiveness of testing procedures in semiconductor device testing.

Latest Patents

One of Maeda's latest patents involves implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing. This method allows for debugging test procedures by receiving commands to update modified test procedures and saving state information for a test plan. The process includes suspending execution, unloading modified procedures, compiling them, and resuming execution in a second debugging session.

Another significant patent by Maeda addresses the use of shared pins in a concurrent test execution environment. This method relates to scheduling tests in concurrently executing test flows for automated test equipment (ATE). It ensures that resources can be shared between test flows, optimizing the execution of tests that require common resources.

Career Highlights

Hironori Maeda has worked with prominent companies in the technology sector, including Advantest Corporation and Mitsubishi Electric Corporation. His experience in these organizations has contributed to his expertise in automated testing and semiconductor technologies.

Collaborations

Maeda has collaborated with notable professionals in his field, including Mark Elston and Leon Chen. These collaborations have likely enriched his work and contributed to the development of innovative testing solutions.

Conclusion

Hironori Maeda's contributions to automated testing technologies have made a significant impact in the industry. His innovative patents and collaborations reflect his dedication to advancing testing methodologies in semiconductor device testing.