The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Nov. 26, 2008
Applicant:
Hironori Maeda, Tatebayashi, JP;
Inventor:
Hironori Maeda, Tatebayashi, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/14 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract
The testing method of the present invention for testing a plurality of devices under test connected to a test module includes (a) determining combinations of devices under test that can theoretically be measured simultaneously from among the combinations of the plurality of devices under test based on at least the connection relationship between the test module and the plurality of devices under test. The testing method further includes (b) testing the plurality of devices under test by sequentially selecting the combinations of devices under test to be actually measured simultaneously from the combinations determined in (a).