The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Feb. 21, 2013
Advantest Corporation, Tokyo, JP;
Mark Elston, Salinas, CA (US);
Harsanjeet Singh, Danville, CA (US);
Ankan Pramanick, San Jose, CA (US);
Leon Lee Chen, San Jose, CA (US);
Hironori Maeda, Gumma, JP;
Chandra Pinjala, San Jose, CA (US);
Ramachandran Krishnaswamy, Cupertino, CA (US);
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
A method for using shared pins in a concurrent test execution environment is disclosed. The method relates to scheduling tests in concurrently executing test flows for automated test equipment (ATE) in a way so that resources can be shared between the test flows. The method comprises determining if any of a plurality of splits used by a first test contains at least one resource that is shared, wherein the first test and a second test are sequenced for execution in two separate concurrently executing test flows. The method further comprises determining if the first test should execute before the second test if the split is associated with resources required by both the second and first tests. Finally the method comprises reserving the split containing the at least one shared resource for access by the first test before beginning execution of the first test.