Santa Clara, CA, United States of America

Hiroki Yamoto


Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 21(Granted Patents)


Company Filing History:


Years Active: 2004

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2 patents (USPTO):Explore Patents

Title: Hiroki Yamoto - Innovator in Semiconductor Testing Technology

Introduction

Hiroki Yamoto is a prominent inventor based in Santa Clara, CA, known for his contributions to semiconductor testing technology. With a total of 2 patents, he has made significant advancements in the field, particularly in the design and functionality of semiconductor testing devices.

Latest Patents

Yamoto's latest patents include a locking apparatus and loadboard assembly for semiconductor testing devices. This invention focuses on a loadboard assembly that integrates a printed circuit board containing a device under test and an interface board. The interface board is designed with two members that create apertures for contact pins on a test head, allowing for precise placement and locking of the loadboard assembly. His second patent, the test head Hifix, enhances the maintenance and repair process of semiconductor testing apparatuses by allowing easy access without complete disassembly. This innovative design includes a plate that can be moved without detaching it from the test head, streamlining the maintenance process.

Career Highlights

Hiroki Yamoto is currently employed at Adv Antest Corporation, where he continues to develop cutting-edge technologies in semiconductor testing. His work has been instrumental in improving the efficiency and reliability of testing devices, making significant contributions to the industry.

Collaborations

Yamoto has collaborated with notable colleagues, including Niels Markert and Anthony Le, to further enhance the innovations in semiconductor testing technology.

Conclusion

Hiroki Yamoto's contributions to semiconductor testing technology through his patents and work at Adv Antest Corporation highlight his role as a key innovator in the field. His inventions are paving the way for more efficient and effective testing solutions in the semiconductor industry.

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