Otsu, Japan

Hiroki Sugihara

USPTO Granted Patents = 5 

 

Average Co-Inventor Count = 1.5

ph-index = 2

Forward Citations = 9(Granted Patents)


Location History:

  • Shiga, JP (2008)
  • Otsu, JP (2021 - 2023)

Company Filing History:


Years Active: 2008-2023

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5 patents (USPTO):Explore Patents

Title: Hiroki Sugihara: Innovator in Inspection Technologies

Introduction

Hiroki Sugihara is a prominent inventor based in Otsu, Japan. He has made significant contributions to the field of inspection technologies, holding a total of 5 patents. His work focuses on developing methods and apparatuses that enhance the accuracy of defect detection in various structures and molded resin products.

Latest Patents

Hiroki Sugihara's latest patents include an innovative inspection method and manufacturing method for structures, as well as an inspection apparatus and manufacturing apparatus for structures. This invention describes a high-accuracy inspection apparatus that utilizes X-ray emitting means to detect defects within structures. The apparatus comprises multiple X-ray detection means, a distance measurement system, and advanced image processing capabilities. Another notable patent involves an inspection method and manufacturing method for molded resin products. This invention aims to accurately identify defective molded resin products and predict potential future deformations by measuring defect candidates' height positions through X-ray transmission.

Career Highlights

Hiroki Sugihara is currently employed at Toray Industries, Inc., where he continues to innovate and develop advanced inspection technologies. His work has significantly impacted the manufacturing and quality assurance processes within the industry.

Collaborations

Hiroki collaborates with talented coworkers, including Takahiro Tanino and Osamu Kuramata, who contribute to his projects and enhance the overall innovation process.

Conclusion

Hiroki Sugihara is a dedicated inventor whose work in inspection technologies has led to significant advancements in defect detection methods. His contributions continue to shape the future of manufacturing and quality assurance.

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