The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2023
Filed:
Dec. 19, 2019
Applicant:
Toray Industries, Inc., Tokyo, JP;
Inventors:
Hiroki Sugihara, Otsu, JP;
Takahiro Tanino, Otsu, JP;
Assignee:
Toray Industries, Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/18 (2018.01); G01B 11/06 (2006.01); G01N 23/04 (2018.01); G01N 23/083 (2018.01); B60K 15/03 (2006.01);
U.S. Cl.
CPC ...
G01N 23/18 (2013.01); G01B 11/0608 (2013.01); G01N 23/04 (2013.01); G01N 23/083 (2013.01); B60K 15/03 (2013.01); B60K 2015/03315 (2013.01); G01N 2223/04 (2013.01); G01N 2223/401 (2013.01); G01N 2223/646 (2013.01);
Abstract
An inspection apparatus and method are described for detecting, with high accuracy, whether a structure contains defects, where the inspection apparatus comprises: an X-ray emitting means () for emitting X-rays through two or more paths; one or more X-ray detection means () for detecting the X-rays passing through the a structure (); a multiple position distance measurement means () for measuring the distance from the X-ray emitting means to the structure at a plurality of positions; and an image processing means ().