The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2022
Filed:
Sep. 28, 2018
Toray Industries, Inc., Tokyo, JP;
Hiroki Sugihara, Otsu, JP;
Takahiro Tanino, Otsu, JP;
Toray Industries, Inc., Tokyo, JP;
Abstract
For the purpose of enabling high-accuracy detection as to whether a molded resin product is a non-defective product or a defective product and advance detection of a molded resin product that may suffer deformation or the like in the future, the present invention relates to an inspection method and a manufacturing method for a molded resin product as well as an inspection device and a manufacturing device for a molded resin product, wherein, in an inspection of a joint interface of a molded resin product divided into a plurality of members, the height positions of defect candidates are measured from the results of detecting X rays radiated via at least two paths when the X rays are transmitted through the molded resin product, which makes it possible to detect a defect with high accuracy.