Toray Industries, Inc.

Hiroki Sugihara

Takahiro Tanino

Hiromichi Sasamoto

Keiji Tsuda

Osamu Kuramata

Keita Ikeda

Kazuki Nakata

An inspection apparatus and method are described for detecting, with high accuracy, whether a structure contains defects, where the inspection apparatus comprises: an X-ray emitting means () for emitting X-rays through two or more paths; one or more X-ray detection means () for detecting the X-rays passing through the a structure (); a multiple position distance measurement means () for measuring the distance from the X-ray emitting means to the structure at a plurality of positions; and an image processing means ().

Inspection method and manufacturing method for structure and inspection apparatus and manufacturing apparatus for structure

For the purpose of enabling high-accuracy detection as to whether a molded resin product is a non-defective product or a defective product and advance detection of a molded resin product that may suffer deformation or the like in the future, the present invention relates to an inspection method and a manufacturing method for a molded resin product as well as an inspection device and a manufacturing device for a molded resin product, wherein, in an inspection of a joint interface of a molded resin product divided into a plurality of members, the height positions of defect candidates are measured from the results of detecting X rays radiated via at least two paths when the X rays are transmitted through the molded resin product, which makes it possible to detect a defect with high accuracy.

Inspection method and manufacturing method for molded resin product as well as inspection device and manufacturing device for molded resin product

A lighting for defect inspection of sheet-shaped objects includes: an elongated light application unit configured to apply illumination light to a sheet-shaped object, the light application unit extending in a second direction that is orthogonal to a first direction on a surface of the sheet-shaped object; a first light shielding unit that is located on a light path from the light application unit to the sheet-shaped object, the first light shielding unit having light shielding sections and opening sections alternately arranged; and a second light shielding unit that is located between the first light shielding unit and the sheet-shaped object, the second light shielding unit having light shielding sections and opening sections alternately arranged in a direction parallel to the second direction.

Lighting for defect inspection of sheet-shaped objects, defect inspection apparatus for sheet-shaped objects, and method of defect inspection of sheet-shaped objects

A cylindrical-body surface inspection device includes: a light irradiation unit configured to irradiate the cylindrical body with light; a two-dimensional imaging unit; a scanning-position determination unit configured to determine at a predetermined period, with respect to two-dimensional image data acquired by the two-dimensional imaging unit, a scanning position that is corresponding to a circumferential direction of the cylindrical body; a time-series scanning image generator configured to perform extraction of image data in a second direction perpendicular to the first direction at the scanning position determined by the scanning-position determination unit on a plurality of pieces of the two-dimensional image data acquired by the two-dimensional imaging unit, and generate a time-series scanning image by arranging in chronological order in the first direction each piece of extracted image data of the second direction; and an inspection unit configured to inspect the time-series scanning image to detect a defect.

Cylindrical body surface inspection device and cylindrical body surface inspection method

A method of inspecting a display panel having a substrate and a plurality of fluorescent layers including measuring bright and dark signals reflected by the fluorescent layers while moving the substrate or an illuminating means generating the signals and an imaging means receiving the signals in a direction across the plurality of fluorescent layers at predetermined intervals, and measuring an application volume for each fluorescent layer from the signals obtained by the imaging means.

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Otsu, Japan

Hiroki Sugihara