Hiroki Moriya

Title: Hiroki Moriya and Ion Detector Innovations.

Introduction

Hiroki Moriya is an inventor based in Hamamatsu, Japan, associated with Hamamatsu Photonics K.K. His patent work focuses on ion detector designs intended to support reliable electron multiplication and ion detection. He is credited with 2 patents.

Latest Patents

Moriya’s listed patents concern ion detectors that use dynodes and semiconductor detectors with electron multiplication functions.

One patent describes a multimode ion detector with two electron detection portions that operate at different multiplication factors. A gate part uses at least the final-stage dynode as a gate electrode, adjusting its potential to control whether secondary electrons pass toward the first detection portion. The design aims to suppress degradation over time in the electron multiplication mechanism.

Another patent describes an ion detector with a focus electrode positioned along the path of secondary electrons traveling from a dynode unit toward a semiconductor detector. An opening in the focus electrode allows the electrons to pass, while the electrode guides them onto the detector’s electron-incidence surface. This arrangement is also intended to help limit degradation over time.

Career Highlights

Moriya’s documented patent contributions center on ion detection, electron multiplication, and the guidance and control of secondary electrons. His work is associated with Hamamatsu Photonics K.K., a company based in Hamamatsu.

Collaborations

The provided information lists Takeshi Endo and Toshinari Mochizuki as Moriya’s coworkers. It does not specify their roles in the cited patents.

Conclusion

Hiroki Moriya’s two listed patents address ion detector designs that control or guide secondary electrons, with the aim of supporting stable operation and reducing degradation over time.