Tokyo, Japan

Hiroki Ihara

This inventor holds 4 USPTO granted patents and 1 EPO patent. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation. Active years: 2010-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroki Ihara. Retrieved from https://idiyas.com/inventor/hiroki-ihara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 3.6

ph-index = 2

Forward Citations = 17(Granted Patents)


Location History:

  • Shiroi, JP (2010)
  • Tokyo, JP (2020)

Company Filing History:


Years Active: 2010-2020

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4 patents (USPTO):Explore Patents

Title: Hiroki Ihara: Innovator in Specimen Inspection Automation

Introduction

Hiroki Ihara is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of specimen inspection automation, holding a total of 4 patents. His innovative work has advanced the efficiency and effectiveness of specimen processing systems.

Latest Patents

One of Ihara's latest patents is the "Specimen Inspection Automation System." This system includes a processing unit that processes specimens, a conveying line for carriers, a control device that manages the conveying of these carriers, and external connection modules for delivering carriers to and from external devices. The control device ensures that the number of carriers within the system remains within a fixed range based on the carriers conveyed in and out by the external connection modules.

Another significant patent is the "Specimen Conveyance Device and Specimen Processing System." This invention features a connection unit that links two processing systems, allowing for necessary processing on specimens held in containers. Each processing system has an opening and closing part that exposes an access surface for operators. The design of the connection unit allows for various layouts within an inspection room, enhancing operational ease without compromising functionality.

Career Highlights

Hiroki Ihara has worked with prominent companies such as Hitachi High-Technologies Corporation and Hitachi High-Tech Corporation. His experience in these organizations has contributed to his expertise in developing advanced specimen inspection technologies.

Collaborations

Ihara has collaborated with notable coworkers, including Toshiki Yamagata and Yoshihiro Nagaoka. Their combined efforts have fostered innovation in the field of specimen inspection automation.

Conclusion

Hiroki Ihara's contributions to specimen inspection automation through his patents and career achievements highlight his role as a key innovator in this field. His work continues to influence the efficiency of specimen processing systems, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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