The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Aug. 19, 2016
Applicant:
Hitachi High-technologies Corporation, Tokyo, JP;
Inventors:
Shigeki Yamaguchi, Tokyo, JP;
Shigeru Yano, Tokyo, JP;
Toshiki Yamagata, Tokyo, JP;
Hiroki Ihara, Tokyo, JP;
Assignee:
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); G01N 35/02 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); G01N 35/00584 (2013.01); G01N 35/02 (2013.01); G01N 35/0092 (2013.01); G01N 35/00603 (2013.01); G01N 2035/0462 (2013.01); G01N 2035/0465 (2013.01);
Abstract
This specimen inspection automation system is provided with: a processing unit which processes a specimen; a conveying line which conveys carriers; a control device which controls the conveying of the carriers; and external connection modules which deliver the carriers to and from external devices. The control device controls the number of carriers in the specimen inspection automation system within a fixed range on the basis of the number of carriers conveyed into and out of the system by the external connection modules.