Tokyo, Japan

Hiroki Ando

This inventor holds 2 USPTO granted patents and 6 published patent applications. Top assignee: Adv Antest Corporation. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroki Ando. Retrieved from https://idiyas.com/inventor/hiroki-ando-vf0uv0ia

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 50.0

Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2006

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Hiroki Ando: Innovator in Testing Apparatus Technology

Introduction

Hiroki Ando is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of testing apparatus technology. With a total of 2 patents to his name, Ando's work focuses on enhancing the efficiency and accuracy of testing devices.

Latest Patents

Ando's latest patents include innovative designs for testing apparatuses. The first patent describes a testing apparatus that incorporates a first power supply unit and first and second coaxial cables. This design allows the first power supply to supply current to a device under test, utilizing the coaxial cables to conduct current effectively. The second patent outlines a more complex testing apparatus that includes a power source, a coaxial cable unit, a detecting unit, and a judging unit. This apparatus is designed to assess the quality of the device under test based on the voltage detected when current is supplied.

Career Highlights

Hiroki Ando is currently employed at Adv Antest Corporation, where he continues to develop innovative testing solutions. His work has been instrumental in advancing the technology used in testing devices, making them more reliable and efficient.

Collaborations

Ando collaborates with talented individuals in his field, including coworkers Kunihiro Matsuura and Hironori Tanaka. Their combined expertise contributes to the success of their projects and the advancement of testing technology.

Conclusion

Hiroki Ando is a notable inventor whose contributions to testing apparatus technology have made a significant impact. His innovative patents and collaborative efforts continue to push the boundaries of what is possible in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…