The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2006
Filed:
Dec. 17, 2003
Hironori Tanaka, Tokyo, JP;
Kunihiro Matsuura, Tokyo, JP;
Satoshi Kodera, Tokyo, JP;
Hiroki Ando, Tokyo, JP;
Yasuhiro Urabe, Tokyo, JP;
Hironori Tanaka, Tokyo, JP;
Kunihiro Matsuura, Tokyo, JP;
Satoshi Kodera, Tokyo, JP;
Hiroki Ando, Tokyo, JP;
Yasuhiro Urabe, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A testing apparatus for testing a device under test, includes a power source for generating a current, a coaxial cable unit for supplying the current to the device under test, a detecting unit for detecting a voltage applied to the device under test when the current is supplied to the device under test and a judging unit for judging quality of the device under test based on the detected voltage, wherein the coaxial cable unit includes a first coaxial cable including a first internal conductor and a first external conductor, and a second coaxial cable including a second internal conductor and a second external conductor, wherein the first internal conductor and the second external conductor conduct a current from the power source towards the device under test, and the first external conductor and the second internal conductor conduct a current from the device under test towards the power source.