This inventor holds 3 USPTO granted patents. Top assignee: Kabushiki Kaisha Nihon Micronics. Active years: 2013-2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Tokyo, JP (2013)
- Musashino, JP (2015)
Company Filing History:
Years Active: 2013-2015
Title: The Innovative Contributions of Hikaru Masuta
Introduction
Hikaru Masuta is a prominent inventor based in Musashino, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 3 patents. His work focuses on improving the inspection processes for power semiconductor devices, which are crucial in various electronic applications.
Latest Patents
Masuta's latest patents include a probe assembly for inspecting power semiconductor devices and an inspection apparatus utilizing this technology. The probe assembly features a probe block with multiple probe holding holes, each containing a probe that contacts the power semiconductor device during inspection. This design allows for accurate inspection by minimizing temperature rises in both the probes and the device under test. Additionally, he has developed an inspection apparatus that includes probes for both front and back side electrodes, along with a chuck stage that facilitates movement during the inspection process.
Career Highlights
Hikaru Masuta is associated with Kabushiki Kaisha Nihon Micronics, a company known for its advancements in semiconductor inspection technology. His innovative designs have enhanced the efficiency and accuracy of semiconductor device testing, making a significant impact in the industry.
Collaborations
Masuta has worked alongside notable colleagues such as Katsuo Yasuta and Hideki Nei. Their collaborative efforts have contributed to the development of cutting-edge technologies in semiconductor inspection.
Conclusion
Hikaru Masuta's contributions to semiconductor technology through his patents and collaborative work have established him as a key figure in the field. His innovations continue to influence the efficiency of semiconductor device inspections, showcasing the importance of his work in advancing technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile