Hiroshima, Japan

Hideyuki Ichihara


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2006-2010

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2 patents (USPTO):Explore Patents

Title: Innovations by Hideyuki Ichihara

Introduction

Hideyuki Ichihara is a notable inventor based in Hiroshima, Japan. He has made significant contributions to the field of image processing and logic circuit testing. With a total of 2 patents, Ichihara's work has advanced the technology used in defect detection and image quality assessment.

Latest Patents

Ichihara's latest patents include a defect detecting device and a logic circuit test apparatus. The defect detecting device is designed to quickly identify defective regions in digital images using a block generating section, an intra-block sum calculating section, and a statistical processing section. This innovative approach allows for efficient detection with minimal circuitry. The logic circuit test apparatus is engineered to test logic circuits by generating common test signals and switching connections to apply original test signals to the input terminals. This method enhances the testing process for complex logic circuits.

Career Highlights

Ichihara is currently employed at Sharp Kabushiki Kaisha Corporation, where he continues to develop cutting-edge technologies. His work has been instrumental in improving the efficiency and accuracy of image processing devices.

Collaborations

Ichihara has collaborated with notable colleagues such as Toshimasa Kuchii and Koji Isodono. Their combined expertise has contributed to the successful development of innovative technologies in their field.

Conclusion

Hideyuki Ichihara's contributions to the fields of image processing and logic circuit testing highlight his role as a significant inventor. His patents reflect a commitment to advancing technology and improving efficiency in defect detection and testing methods.

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