The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2006
Filed:
Sep. 24, 2003
Koji Isodono, Kashiba, JP;
Hideyuki Ichihara, Hiroshima, JP;
Koji Isodono, Kashiba, JP;
Hideyuki Ichihara, Hiroshima, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
A logic circuit test apparatus for testing a logic circuit having a plurality of input terminals and a plurality of output terminals, the logic circuit test apparatus including: a common test signal generating circuit which groups the input terminals of the logic circuit on the basis of logic states of original test signals to be applied to the respective input terminals of the logic circuit and outputs common test signals from common test signal output terminals thereof smaller in number than the input terminals of the logic circuit; and an input connection switching circuit which switches connections of the common test signal output terminals of the common test signal generating circuit with the input terminals of the logic circuit so as to convert the common test signals into the original test signals and apply the original test signals to the respective input terminals of the logic circuit.