The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Sep. 26, 2006
Toshimasa Kuchii, Nara, JP;
Hideyuki Ichihara, Hiroshima, JP;
Toshimasa Kuchii, Nara, JP;
Hideyuki Ichihara, Hiroshima, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
A defect detecting device includes: a block generating section dividing an inspection image in which a defective region will be detected into a plurality of blocks; an intra-block sum calculating section calculating an intra-block sum for each of the blocks generated by the block generating section, the intra-block sum being a sum of pixel data for pixels in that block; and a statistical processing section and a defect determining section determining whether there exists a defective region by determining through statistical processing whether the intra-block sums have an outlier. Accordingly, the device determines whether there is a defective region in a digital image quickly and using small circuitry.