Hideo Sakagawa

Title: Hideo Sakagawa: Innovator in Electrical Measurement Technologies

Introduction

Hideo Sakagawa is a prominent inventor based in Nirasaki, Japan. He has made significant contributions to the field of electrical measurement technologies, holding a total of 3 patents. His work focuses on developing advanced probing methods and equipment for measuring the electrical characteristics of circuit devices.

Latest Patents

Sakagawa's latest patents include a prober designed for measuring the electrical characteristics of circuit devices. This innovative prober consists of a tester, stage, probe card, first sensor, second sensor, and controller. The stage is responsible for placing a test target object, which features multiple electrical circuit devices on its surface. Each of these devices is equipped with several electrodes. The probe card is positioned above the stage and contains multiple probes connected to the tester. The first sensor detects the positions of the distal ends of the probes, while the second sensor identifies the surface position of individual electrical circuit devices. The controller ensures that the probes and electrodes make contact, facilitating accurate measurements.

Career Highlights

Hideo Sakagawa is currently employed at Tokyo Electron Limited, a leading company in the semiconductor and electronics industry. His role involves the development of innovative technologies that enhance the efficiency and accuracy of electrical measurements in circuit devices.

Collaborations

Sakagawa has collaborated with notable coworkers, including Takashi Watanabe and Tetsuo Sato. Their combined expertise contributes to the advancement of technologies in their field.

Conclusion

Hideo Sakagawa's contributions to electrical measurement technologies through his patents and work at Tokyo Electron Limited highlight his importance as an inventor. His innovative approaches continue to shape the future of circuit device testing and measurement.