Kawasaki, Japan

Hideo Iwano


Average Co-Inventor Count = 1.5

ph-index = 3

Forward Citations = 214(Granted Patents)


Company Filing History:


Years Active: 1987-1990

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3 patents (USPTO):Explore Patents

Title: Hideo Iwano: Innovator in Coordinate Measuring Technology

Introduction

Hideo Iwano is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of coordinate measuring instruments, holding a total of 3 patents. His work focuses on enhancing measurement accuracy and efficiency in various applications.

Latest Patents

One of Hideo Iwano's latest patents is a coordinate measuring instrument and method of generating pattern data. This innovative instrument measures the size and other factors of a workpiece by analyzing the three-dimensional relative movement between a probe sensor and the work. The method for generating reference work shape pattern data is designed for automatic measurement. The instrument features a CAD component that converts design data into shape pattern data, a measuring part that adds conditions to the shape pattern data, and a system for setting and inputting measuring conditions. This allows for the creation of an optimal measuring program without the need for reference work or actual work. The method also includes generating measurement plane shape patterns through sweeping with basic lines and combining them to form a three-dimensional pattern.

Career Highlights

Hideo Iwano has worked with prominent companies in the industry, including Mitutoyo Manufacturing Co., Ltd. and Mitutoyo Corporation. His experience in these organizations has contributed to his expertise in coordinate measuring technology.

Collaborations

Throughout his career, Hideo Iwano has collaborated with notable colleagues such as Soichi Kadowaki and Kazuo Shudo. These partnerships have further enriched his work and innovations in the field.

Conclusion

Hideo Iwano's contributions to coordinate measuring technology have made a significant impact on the industry. His innovative patents and collaborations reflect his dedication to advancing measurement techniques.

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