The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 1990
Filed:
Feb. 19, 1988
Hideo Iwano, Kawasaki, JP;
Soichi Kadowaki, Tokyo, JP;
Mitutoyo Corporation, Tokyo, JP;
Abstract
A coordinate measuring instrument which measures the size and other factors of a work from amount of three-dimensional relative movement between a probe sensor and the work, as well as a method for generating a reference work shape pattern data which is to be used in automatic measurement. The coordinate measuring instrument has a CAD part for converting design data into shape pattern data, a measuring part for generating, by adding measuring conditions to the shape pattern data, measurement information which includes instructions concerning measuring procedure to be output to a controller, and measuring procedure instruction means having a system for setting and inputting the measuring conditions, whereby an optimum measuring program can be formed without necessitating any reference work or actual work. The method of generating the shape pattern data includes the steps of generating measurement plane shape patterns by effecting sweeping with basic lines and suitably combining the measurement plane shape patterns so as to form a three-dimensional pattern.