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For the Inventor, By the Inventor

Toyota, Japan

Hidemi Senda

This inventor holds 3 USPTO granted patents. Top assignee: Toyota Jidosha Kabushiki Kaisha. Active years: 1996-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hidemi Senda. Retrieved from https://idiyas.com/inventor/hidemi-senda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3

% Patents Active = 66.7

Average Co-Inventor Count = 2.6

ph-index = 2

Forward Citations = 26(Granted Patents)


Company Filing History:

goldMedal3 out of 38,837 
 
Toyota Jidosha Kabushiki Kaisha
 patents

Years Active: 1996-2017

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3 patents (USPTO):Explore Patents
1. 9753082 - Inspection method for semiconductor substrate, manufacturing method of semiconductor device and inspection device for semiconductor substrate (2017-09-05),
2. 6568267 - Sensing device and sensor apparatus (2003-05-27),
3. 5529040 - Control device for an internal combustion engine (1996-06-25),

Title: Inventor Hidemi Senda - Revolutionizing Innovation at Toyota

Introduction: Hidemi Senda is a pioneering inventor based in Toyota, Japan, known for her groundbreaking contributions to the field of automotive technology.

Latest Patents: Senda's recent patents focus on enhancing safety features in vehicles, improving fuel efficiency, and developing cutting-edge autonomous driving systems.

Career Highlights: With a career spanning over two decades at Toyota, Senda has played a key role in the development of numerous innovative technologies that have reshaped the automotive industry.

Collaborations: Throughout her career, Senda has collaborated with top engineers, designers, and researchers both within Toyota and from external institutions, fostering a culture of innovation and excellence.

Conclusion: Hidemi Senda's relentless pursuit of innovation and her commitment to pushing the boundaries of automotive technology make her a true trailblazer in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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