Yokohama, Japan

Hideki Nukada

USPTO Granted Patents = 30 

Average Co-Inventor Count = 2.1

ph-index = 7

Forward Citations = 236(Granted Patents)


Location History:

  • Tokyo, JP (1987)
  • Kanagawa-ken, JP (2003 - 2017)
  • Kanagawa, JP (2009 - 2017)
  • Yokohama, JP (1993 - 2018)

Company Filing History:


Years Active: 1987-2018

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30 patents (USPTO):

Title: Innovations by Hideki Nukada: A Pioneer in Pattern Inspection Technologies

Introduction: Hideki Nukada, a prominent inventor based in Yokohama, Japan, has made significant contributions to the field of pattern inspection technology. With an impressive portfolio of 30 patents, his inventive prowess has led to advancements that aid in the accurate inspection and imaging of patterns.

Latest Patents: Among Nukada's latest inventions are two groundbreaking patents: the "Pattern Inspection Apparatus and Pattern Inspection Method" and the "Pattern Imaging Apparatus and Pattern Imaging Method." The first patent outlines a sophisticated pattern inspection apparatus featuring a substrate mounting stage that is capable of two-dimensional movement. This apparatus includes multiple detectors arranged strategically around the stage to enhance measurement accuracy, alongside sensors that capture optical images of patterns on the substrate. The accompanying calculation circuitry facilitates precise image acquisition through a two-dimensional scale, while a comparison function enables pixel-wise comparison with reference images. The second patent builds upon these principles, incorporating dual two-dimensional scales for enhanced measurement and an innovative approach to capture and analyze the optical images of inspection target objects.

Career Highlights: Throughout his career, Hideki Nukada has been associated with leading technology companies such as Toshiba Corporation and Nuflare Technology, Inc. His work has consistently focused on developing reliable inspection technologies, propelling advancements in manufacturing and quality control sectors.

Collaborations: In his journey as an inventor, Nukada has collaborated with esteemed professionals, including Yuko Nomura and Yasushi Shinjo. These collaborations have enriched his work and contributed to the successful realization of multiple innovative projects.

Conclusion: Hideki Nukada stands as a leading figure in pattern inspection technology, with his 30 patents reflecting a deep commitment to innovation. His ingenious designs not only push the boundaries of technology but also enhance efficiency in various industrial applications. The impact of his work will undoubtedly resonate within the field for years to come.

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