The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Aug. 01, 2016
Nuflare Technology, Inc., Yokohama-shi, JP;
Hideki Nukada, Yokohama, JP;
NuFlare Technology, Inc., Yokohama-shi, JP;
Abstract
A pattern inspection apparatus includes a first stage to mount an inspection target object, located at the position displaced from the gravity center of the first stage, first and second two-dimensional scales on the first stage and opposite each other with respect to the gravity center, a second stage under a region overlapping with the gravity center of the first stage and not overlapping with the target object, to support and move the first stage, a calculation processing circuitry to calculate the position of the inspection target object, using position information measured by the first and second two-dimensional scales, a sensor to capture an optical image of a pattern on the inspection target object in the state where the first stage on which the inspection target object is mounted is moving, and a comparison unit to compare, for each pixel, the optical image with a corresponding reference image.