Utsunomiya, Japan

Hideki Kumagai

This inventor holds 2 USPTO granted patents. Top assignee: Mitutoyo Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hideki Kumagai. Retrieved from https://idiyas.com/inventor/hideki-kumagai-aq24zzfo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.7

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2013

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2 patents (USPTO):Explore Patents

Title: Hideki Kumagai: Inventor of Precision Measurement Technologies.

Introduction

Hideki Kumagai is an inventor based in Utsunomiya, Japan, whose work focuses on three-dimensional measurement technology. He is associated with Mitutoyo Corporation and holds 2 patents.

Latest Patents

Kumagai’s latest patents include inventions related to three-dimensional measuring instruments and measurement devices.

The three-dimensional measuring instrument patent describes a spindle that moves an object along a predetermined axis and a controller that manages its position. An absolute-type linear encoder reports the spindle’s absolute position, enabling measurement to begin in a shorter time.

The measurement device patent describes a three-dimensional measuring machine with a probe, contact-detection sensor, and structure for moving the probe along three orthogonal axes. Scale sensors detect the probe’s coordinates, while counters record touch signals and coordinate data. A latch controller captures the counter values simultaneously.

Career Highlights

Kumagai’s patented work addresses practical aspects of precision measurement, including faster startup and synchronized recording of probe contact and position data. His inventions are associated with Mitutoyo Corporation, a company known for measurement equipment.

Collaborations

Kumagai’s listed coworkers include Kazumi Mizukami and Takashi Majima.

Conclusion

Hideki Kumagai’s patents reflect a focus on improving the speed and coordination of three-dimensional measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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